Statistical analysis of microstructures in materials science / by Joachim Ohser and Frank Mucklich.

By: Ohser, JoachimMaterial type: TextTextLanguage: English Publication details: New York : John Wiley & Sons, Inc. , 2000Description: xxii, 381pISBN: 0-471-97486-2Subject(s): Stochastic geometryColon classification: B28
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Item type Current library Call number Status Date due Barcode
Books Central Library Manipur University
B28 P0 (Browse shelf (Opens below)) Available 1023/Stat

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