Scanning electron microscopy: physics of image formation and microanalysis / by edited by Ludwig Reimer.
Material type: TextLanguage: English Publication details: New York : Springer-Verlag , 1998Edition: 2nd edDescription: XIV,527pISBN: 3-540-63976-4Subject(s): Physics- Scanning electron microscopyColon classification: C9B5:(G:19)Item type | Current library | Call number | Status | Date due | Barcode |
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Text Books | Central Library Manipur University | C9B5:(G:19) N8 (Browse shelf (Opens below)) | Available | 2917/Phy |
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