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Physical principles of Electron microscopy: an introduction to TEM, SEM and AEM / by R.F. Egerton

By: Egerton, R.F [Author]Publication details: Switzerland: Springer, 2016Edition: 2nd edDescription: xi, 196pISBN: 9783319398761Colon classification: C9B5

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Item type	Current library	Collection	Call number	Copy number	Status	Date due	Barcode
Text Books	Central Library Manipur University	Physics	CM9 Q6 (Browse shelf (Opens below))		Available		4241/Phy
Books	Central Library Manipur University Textbook Section	General Book	C9B5 Q6;1 (Browse shelf (Opens below))	2	Not For Loan		4333/Phy

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Previous	C83 R2 Recent advances in condensed matter physics /	C9B2 Q7 Cutting edge nanotechnology /	C9B2,N(F) Q8 Nanotechnology: nanostructures and nanomaterials /	C9B5 Q6;1 Physical principles of Electron microscopy: an introduction to TEM, SEM and AEM /	C:(B) M9 Mathematical methods of classical mechanics /	C:(BV) Q1 Computational physics /	CN1 GoD,J8 The Principles of Quantum Mechanics	Next

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