Manipur University Library › Details for: Atomic force microscopy in process engineering: introduction to AFM for improved processes and products /

Normal view MARC view ISBD view

Atomic force microscopy in process engineering: introduction to AFM for improved processes and products / by W Richard Bowen and Nidal Hilal.

By: Bowen, W. RichardMaterial type: Text

TextLanguage: English Publication details: Oxford : Elsevier Ltd. , 2009Description: xvi, 283pISBN: 978-1-85617-517-3Subject(s): Engineering- Atomic forcce microscopyColon classification: C(E:14)

Tags from this library: No tags from this library for this title. Log in to add tags.

Average rating: 0.0 (0 votes)

Item type	Current library	Call number	Status	Date due	Barcode
Text Books	Central Library Manipur University	C(E:14) P9 (Browse shelf (Opens below))	Available		4006/Phy

There are no comments on this title.

to post a comment.