Scanning electron microscopy: physics of image formation and microanalysis / by edited by Ludwig Reimer.

By: Reimer, LudwigMaterial type: TextTextLanguage: English Publication details: New York : Springer-Verlag , 1998Edition: 2nd edDescription: XIV,527pISBN: 3-540-63976-4Subject(s): Physics- Scanning electron microscopyColon classification: C9B5:(G:19)
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Item type Current library Call number Status Date due Barcode
Text Books Text Books Central Library Manipur University
C9B5:(G:19) N8 (Browse shelf (Opens below)) Available 2917/Phy

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