Applied logistic regression / by David W. Hosmer; Stanley Lemeshow.

By: Hosmer, David WMaterial type: TextTextLanguage: English Publication details: New York : John Wiley & Sons, Inc. , 2000Edition: 2nd edDescription: xii, 373pISBN: 0-471-35632-8Subject(s): Regression analysisColon classification: R1
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Books Central Library Manipur University
R1 P0 (Browse shelf (Opens below)) Available 369/Stat

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