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Applid logistic regression / y David W. Hosmer & Stanley Lemeshow.

By: Hosmer, David WMaterial type: Text

TextLanguage: English Publication details: New York : John Wiley & Sons, Inc. , 2000Edition: 2nd edDescription: 375pISBN: 0-471-35632-8Subject(s): StatisticsColon classification: B

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Item type	Current library	Call number	Status	Date due	Barcode
Books	Central Library Manipur University	B P0 (Browse shelf (Opens below))	Available		410/Sts

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