X-Ray Microscopy: Proceedings of the International symposium, gottingen,Fed. Rep. of Germany, September, 14-16,1983 / by G.Schmahl.

By: Schmahl, ^GMaterial type: TextTextLanguage: English Publication details: New York : Springer-Verlag , 1997Edition: 1st edDescription: 345pISBN: 3-540-13271-6Subject(s): PhysicsColon classification: C53
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