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Points Defects in Semiconductors II:Experimental Aspects /

By: Bourgoin, JMaterial type: Text

TextLanguage: English Publication details: New York : Springer-Verlag , 1980Edition: 1st edDescription: xvi, 295pISBN: 3 540 11514 3Subject(s): Physics <Semiconductors>Colon classification: C4:24:f3

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Item type	Current library	Call number	Status	Date due	Barcode
Books	Central Library Manipur University	C4:24:f3 M3 (Browse shelf (Opens below))	Available		521/Phy

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Previous	C4:24 P3 Handbook of high-temperature superconductor electronics /	C4:24 P7 Superconductivity /	C4:24 P9 High-speed electronics and optoelectronics: device and circuits /	C4:24:f3 M3 Points Defects in Semiconductors II:Experimental Aspects /	C4:24n K6.1 Semiconductors and Semimetals /	C4:24n K6.10 Semiconductors and Semimetals /	C4:24n K6.11 Semiconductors and Semimetals /	Next

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