Microscopy of Materials:Modern Imaging methods Using Electron, Xray and Ion beams /

By: Bowen, D. KMaterial type: TextTextLanguage: English Publication details: London : Macmillan Press Ltd. , 1975Edition: 1st edDescription: ix, 304pSubject(s): Physics <Microscopy>Colon classification: C53:3:1
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Item type Current library Call number Status Date due Barcode
Books Central Library Manipur University
C53:3:1 L5B (Browse shelf (Opens below)) Available 14932

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