Characterization of Crystal Growth Defects by X-ray Methods /

By: Tanner, Brian KMaterial type: TextTextLanguage: English Publication details: New York-10011 : Plenum Press , 1978Edition: 1st edDescription: xxvi, 589pISBN: 0 306 40628 4Subject(s): Physics <Crystal Growth Defects>Colon classification: C53
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Item type Current library Call number Status Date due Barcode
Books Central Library Manipur University
C53 M0 (Browse shelf (Opens below)) Available 730/Phy

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