000 00476nam a2200169Ia 4500
008 211115s9999 xx 000 0 und d
020 _a0 306 40628 4
041 _aeng
082 _aC53
_bM0
100 _aTanner, Brian K..
245 0 _aCharacterization of Crystal Growth Defects by X-ray Methods /
250 _a1st ed /
260 _aNew York-10011 :
_bPlenum Press ,
_c1978
300 _axxvi, 589p :
650 _aPhysics <Crystal Growth Defects>
942 _cTB
999 _c24029
_d24029