Ohser, Joachim  . <br/><br/>
Statistical analysis of microstructures in materials science /  
by Joachim Ohser and Frank Mucklich. 
 - New York :   John Wiley & Sons, Inc. ,   2000 
 - xxii, 381p ;  
<br/><br/><label>ISBN: </label>0-471-97486-2 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Stochastic geometry
<br/><br/><label>Dewey Class. No.: </label>B28  / P0