TY  - BOOK
AU  - Brandon, David  .
TI  - Microstructural characterization of materials / 
SN  - 978-0-470-02784-4
U1  - C 
PY  - 2008///
CY  - New York : 
PB  - John Wiley & Sons, Inc. , 
KW  - Microstructure
ER  -