Van der Linden, Wim J  . <br/><br/>
Linear models for optimal test design /  
by Wim J.van der linden. 
 - New York :   Springer-Verlag ,   2005 
 - xxiii, 408p :  
<br/><br/><label>ISBN: </label>0-387-20272-2 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Optimal test design
<br/><br/><label>Dewey Class. No.: </label>B28  / P5;1