Reimer, Ludwig . <br/><br/>
Scanning electron microscopy: physics of image formation and microanalysis /  
by edited by Ludwig Reimer. 
 - 2nd ed /  
 - New York :   Springer-Verlag ,   1998 
 - XIV,527p ;  
<br/><br/><label>ISBN: </label>3-540-63976-4 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Physics- Scanning electron microscopy
<br/><br/><label>Dewey Class. No.: </label>C9B5:(G:19)  / N8