TY  - BOOK
AU  - Lannoo, M..
TI  - Point Defects in Semiconductors I:Theoretical Aspects / 
SN  - 3 540 10518 2
U1  - C6:21 
PY  - 1974///
CY  - New York : 
PB  - Springer-Verlag , 
KW  - Physics <Point defect, semiconductor>
ER  -