TY  - BOOK
AU  - Tanner, Brian K..
TI  - Characterization of Crystal Growth Defects by X-ray Methods / 
SN  - 0 306 40628 4
U1  - C53 
PY  - 1978///
CY  - New York-10011 : 
PB  - Plenum Press , 
KW  - Physics <Crystal Growth Defects>
ER  -